Shrinkage Effects of the Conduction Zone in the Electrical Properties of Metal Oxide Nanocrystals: The Basis for Room Temperature Conductometric Gas Sensor

Figure 1

(a) Low angle X-ray diffractogram of mesoporous In₂O₃. Dotted line corresponds to KIT-6 silica. The replica clearly shares the same large-scale mesoporous structure with the silica template. (b) Wide angle XRD of KIT-6 In₂O₃. Main diffraction peaks of the cubic structure Ia-3 of In₂O₃ are clearly identified. (c) High-resolution Transmission Electron Microscopy and selected area diffraction pattern on the squared region of an In₂O₃ KIT-6 mesoporous replica. A sketch of the KIT-6 mesoporous structure is included for clarity (reprinted with permission from [14] Rossinyol, et al. Adv. Funct. Mater. 17, 1801–1806, 2007, Wiley-VCH Verlag GmbH & Co. KGaA (2007)).

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