Research Article
Vertical MEMS Resonators for Real-Time Clock Applications
Table 1
Thelma technology parameters.
| | Structural layer | 1st oxide | Buried poly silicon | 2nd oxide | Substrate |
| Thickness, m | 15 | 1.6 | 0.45 | 2.5 | — | Resistance | 10 Ω/square | — | 25 Ω/square | — | 1 Ω/cm |
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