Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope

<table>(a–d) Schematic field ion images of single-atom <svg height="10.575" id="M33" style="vertical-align:-0.20064pt" version="1.1" viewbox="0 0 17.9625 10.575" width="17.9625" xmlns="http://www.w3.org/2000/svg">
<g transform="matrix(1.25,0,0,-1.25,0,10.575)">
<g transform="translate(72,-63.54)">
<text transform="matrix(1,0,0,-1,-71.95,63.79)">
<tspan style="font-size: 12.50px; " x="0" y="0">𝑊</tspan>
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</svg>(110) tips produced from a hemispherical starting tip (radius 8 nm) via field evaporation according to highest-field, image-force (with/without polarization), and Kreuzer-Nath criteria; (e–h) experimental field ion images (voltage ~8.8 kV) showing the formation of an SAT and evaporation of atoms from below the apex. Arrows indicate features which change between (g) and (h).</table>

Journal of Sensors

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Figure 3

Figure 3: Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope 