Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope

Figure 6

(a, b) Schematic FIM images of 110-oriented hemispherical 𝑊 tip (radius 8 nm) subjected to field evaporation (image-force model without polarization component) at 77 K, single-atom and double tip; (c) experimental image of polycrystalline 𝑊 tip (apex circled) imaged at 77 K, 8.0 kV.

(a)

(b)

(c)