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Journal of Sensors
Volume 2014, Article ID 326316, 7 pages
Research Article

Defect Automatic Identification of Eddy Current Pulsed Thermography

School of Automation Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu, Sichuan 611731, China

Received 18 July 2014; Revised 31 October 2014; Accepted 31 October 2014; Published 31 December 2014

Academic Editor: Ignacio R. Matias

Copyright © 2014 Kai Chen et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Eddy current pulsed thermography (ECPT) is an effective nondestructive testing and evaluation (NDT&E) technique, and has been applied for a wide range of conductive materials. Manual selected frames have been used for defects detection and quantification. Defects are indicated by high/low temperature in the frames. However, the variation of surface emissivity sometimes introduces illusory temperature inhomogeneity and results in false alarm. To improve the probability of detection, this paper proposes a two-heat balance states-based method which can restrain the influence of the emissivity. In addition, the independent component analysis (ICA) is also applied to automatically identify defect patterns and quantify the defects. An experiment was carried out to validate the proposed methods.