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Journal of Sensors
Volume 2015, Article ID 678120, 19 pages
http://dx.doi.org/10.1155/2015/678120
Research Article

Fault Line Selection Method of Small Current to Ground System Based on Atomic Sparse Decomposition and Extreme Learning Machine

1School of Electrical Engineering and Automation, Henan Polytechnic University, Jiaozuo 454000, China
2School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China

Received 13 October 2014; Accepted 28 November 2014

Academic Editor: Sergiu Dan Stan

Copyright © 2015 Xiaowei Wang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Xiaowei Wang, Yanfang Wei, Zhihui Zeng, Yaxiao Hou, Jie Gao, and Xiangxiang Wei, “Fault Line Selection Method of Small Current to Ground System Based on Atomic Sparse Decomposition and Extreme Learning Machine,” Journal of Sensors, vol. 2015, Article ID 678120, 19 pages, 2015. https://doi.org/10.1155/2015/678120.