Journals
Publish with us
Publishing partnerships
About us
Blog
Journal of Sensors
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Journal of Sensors
/
2015
/
Article
/
Fig 13
/
Research Article
Fault Line Selection Method of Small Current to Ground System Based on Atomic Sparse Decomposition and Extreme Learning Machine
Figure 13
Information entropy value of every atom library.
(a)
(b)
(c)
(d)