Fault Line Selection Method of Small Current to Ground System Based on Atomic Sparse Decomposition and Extreme Learning Machine

<table class="figure-group"><tr class="fig-image" id="a"><td><object data="https://static.hindawi.com/articles/js/volume-2015/678120/figures/678120.fig.0018a.svgz" name="678120.fig.0018a" type="image/svg+xml"></object></td></tr><tr class="fig-caption"><td><b>(a) </b>10 Ω to ground fault</td></tr><tr class="fig-image" id="b"><td><object data="https://static.hindawi.com/articles/js/volume-2015/678120/figures/678120.fig.0018b.svgz" name="678120.fig.0018b" type="image/svg+xml"></object></td></tr><tr class="fig-caption"><td><b>(b) </b>2000 Ω to ground fault</td></tr></table>

<div>Zero sequence current with strong noise.</div>

Journal of Sensors

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Figure 18

Figure 18: Fault Line Selection Method of Small Current to Ground System Based on Atomic Sparse Decomposition and Extreme Learning Machine 