Research Article
Fault Line Selection Method of Small Current to Ground System Based on Atomic Sparse Decomposition and Extreme Learning Machine
Table 11
Test result of every ELM network.
|
Samples style | ELM |
| Correct samples number/total number | Accuracy rate |
| Main component atom library | 23/24 | Fundamental atom library | 20/24 | Transient characteristic atom library number 1 | 21/24 | Transient characteristic atom library number 2 | 19/24 |
| Total | 83/96 |
|
|