Review Article
EMI Susceptibility Issue in Analog Front-End for Sensor Applications
Table 1
Measured EMI induced offset in commercial amplifiers.
| Amplifier | Technology | Voltage offset | Critical frequencies |
| UA741 | BJT | 650 mV | 0.1 MHz–3 GHz | AD705 | BJT | 350 mV | 0.3 MHz–1 GHz | NE5534 | BJT | 360 mV | 3 MHz–0.6 GHz | OPA177 | BJT | 360 mV | 0.6 MHz–0.1 GHz | OP176 | JFET In/BJT Out | 200 mV | 3 MHz–1 GHz | MC33181 | JFET In/BJT Out | 210 mV | 6 MHz–0.6 GHz | CA3140 | CMOS In/BJT Out | 350 mV | 0.1 MHz–1 GHz | ICL7611 | CMOS | 380 mV | 0.3 MHz–0.3 GHz |
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