Use of a Secondary Current Sensor in Plasma during Electron-Beam Welding with Focus Scanning for Process Control

<table class="figure-group"><tr class="fig-image" id="a"><td><object data="https://static.hindawi.com/articles/js/volume-2016/5302681/figures/5302681.fig.0017a.svgz" name="5302681.fig.0017a" type="image/svg+xml"></object></td></tr><tr class="fig-caption"><td><b>(a) </b>Without focus control</td></tr><tr class="fig-image" id="b"><td><object data="https://static.hindawi.com/articles/js/volume-2016/5302681/figures/5302681.fig.0017b.svgz" name="5302681.fig.0017b" type="image/svg+xml"></object></td></tr><tr class="fig-caption"><td><b>(b) </b>With focus control</td></tr></table>

<div>Cross sections of beads given varying working distances.</div>

Journal of Sensors

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Figure 17

Figure 17: Use of a Secondary Current Sensor in Plasma during Electron-Beam Welding with Focus Scanning for Process Control 