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Journal of Sensors
Volume 2017, Article ID 1961734, 9 pages
https://doi.org/10.1155/2017/1961734
Research Article

Small Signals’ Study of Thermal Induced Current in Nanoscale SOI Sensor

1Lev Academic Center, Faculty of Engineering, Department of Applied Physics/Electro-Optics Engineering, 9116001 Jerusalem, Israel
2Semiconductor Devices Laboratory, Faculty of Engineering, Bar-Ilan University, 52900 Ramat Gan, Israel
3Department of Electro-Optics, Faculty of Engineering, Bar-Ilan University, 52900 Ramat Gan, Israel

Correspondence should be addressed to Avi Karsenty; li.ca.tcj@ytnesrak

Received 5 September 2017; Accepted 16 October 2017; Published 5 November 2017

Academic Editor: Lucio Pancheri

Copyright © 2017 Yaakov Mandelbaum et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Yaakov Mandelbaum, Ilan Gadasi, Avraham Chelly, Zeev Zalevsky, and Avi Karsenty, “Small Signals’ Study of Thermal Induced Current in Nanoscale SOI Sensor,” Journal of Sensors, vol. 2017, Article ID 1961734, 9 pages, 2017. https://doi.org/10.1155/2017/1961734.