Research Article
Inexpensive Measuring System for the Characterization of Organic Transistors
Table 1
Substrate specifications (Ossila).
| | Size/thickness | 20 mm × 15 mm/725 ± 25 μm |
| | Growth/orientation | CZ/(100) | | Type/dopant | p-type/Boron | | Resistivity | 5×10−4 to 10−2 Ω/cm | | Front/back surface | Polished/etched | | Oxide thickness (SiO2) | 300 ± 5% nm | | Capacitance | ≈1.09 × 10−8 F/cm2 |
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