A Finite Element Analysis Approach to Explain Sensitivity Degradation in Force Sensing Resistors Based on Conductive Polymer Composites

Figure 1

(a) Potential barrier scheme for tunneling conduction. (b) Sandwich-like FSR scheme where interparticle separation reduces when the device is subjected to mechanical stress . Electric current flowing through the CPC in a multipath fashion. Blue lines depict the possible paths QT can occur through. Figure not to scale.

(a)

(b)