Research Article
A Finite Element Analysis Approach to Explain Sensitivity Degradation in Force Sensing Resistors Based on Conductive Polymer Composites
Table 2
Tunneling gaps for each version of the “four-particle-model”. See Figure
8 for a graphic representation.
| | Gap | Between which elements model in Figure 8(a) | Between which elements model in Figure 8(b) | Between which elements model in Figure 8(c) | Between which elements model in Figure 8(d) |
| | Upper electrode–particle 2 | Upper electrode–particle 2 | Upper electrode–particle 1 | Upper electrode–particle 1 | | Upper electrode–particle 3 | Upper electrode–particle 1 | Particle 1–particle 2 | Particle 1–particle 2 | | Particle 1–particle 2 | Upper electrode–particle 3 | Particle 2–particle 3 | Particle 2–particle 3 | | Particle 1–particle 3 | Particle 1–particle 2 | Particle 3–particle 4 | Particle 4–particle 2 | | Particle 1–particle 4 | Particle 3–particle 4 | Particle 4–lower electrode | Particle 3–lower electrode | | Particle 2–particle 4 | Particle 2–lower electrode | — | Particle 4–particle 3 | | Particle 3–particle 4 | Particle 4–lower electrode | — | — | | — | Particle 3–lower electrode | — | — |
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