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Spectroscopy
Volume 19, 5,6, Pages 267-274
http://dx.doi.org/10.1155/2005/498649

Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films

W.H. Nosal,1 D.W. Thompson,1 S. Sarkar,2 A. Subramanian,2 and J.A. Woollam1

1Department of Electrical Engineering, University of Nebraska, Lincoln, NE 68588, USA
2Department of Chemical Engineering, University of Nebraska, Lincoln, NE 68588, USA

Copyright © 2005 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Infrared optical properties of spin-cast chitosan films have been determined using spectroscopic ellipsometry. Infrared index of refraction and extinction coefficients from 750 cm–1 to 4000 cm–1 were determined using ellipsometric data fits to dispersion models based on Gaussian shaped oscillators. The free electron contribution was analyzed using a Drude model. This modeling determined that optical anisotropy was present over the entire infrared region. Line shape and oscillator strength analysis was performed to determine oscillator strengths, abundance, and relative bond strength.