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Journal of Spectroscopy
Volume 2013, Article ID 198420, 5 pages
http://dx.doi.org/10.1155/2013/198420
Research Article

Diode-Laser Induced Fluorescence Spectroscopy of an Optically Thick Plasma in Combination with Laser Absorption Spectroscopy

1Department of Advanced Energy, The University of Tokyo, Tokyo 277-0882, Japan
2Department of Aerospace Engineering, The University of Tokyo, Tokyo 113-8656, Japan

Received 13 November 2012; Revised 11 January 2013; Accepted 21 January 2013

Academic Editor: Lorenzo Giuffrida

Copyright © 2013 S. Nomura et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Distortion of laser-induced fluorescence profiles attributable to optical absorption and saturation broadening was corrected in combination with laser absorption spectroscopy in argon plasma flow. At high probe-laser intensity, saturated absorption profiles were measured to correct probe-laser absorption. At low laser intensity, nonsaturated absorption profiles were measured to correct fluorescence reabsorption. Saturation broadening at the measurement point was corrected using a ratio of saturated to non-saturated broadening. Observed LIF broadening and corresponding translational temperature without correction were, respectively,  GHz and  K and corrected broadening and temperature were, respectively,  GHz and  K. Although this correction is applicable only at the center of symmetry, the deduced temperature agreed well with that obtained by LAS with Abel inversion.