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Journal of Spectroscopy
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Journal of Spectroscopy
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2013
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Article
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Fig 2
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Research Article
Optical Characterization of Porous Sputtered Silver Thin Films
Figure 2
SEM images of silver films deposited at 40 mA and 10 Pa for different physical thicknesses: (a) 190 and (b) 1380 nm.
(a)
(b)