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Journal of Spectroscopy
Volume 2013, Article ID 875809, 4 pages
http://dx.doi.org/10.1155/2013/875809
Research Article

Conformity Check of Thickness to the Crystal Plate

Physics Department, Far Eastern State Transport University, 47 Seryshev Street, Khabarovsk 680021, Russia

Received 31 May 2013; Revised 22 September 2013; Accepted 16 October 2013

Academic Editor: Carlos Andres Palacio

Copyright © 2013 Alexander Syuy et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

This work demonstrates that if crystal plates are identical in thickness in the direction of radiation, the intensity at the output of the polarizer-crystal-crystal-analyzer system equals zero. This means that it is possible to control the difference in thickness between the reference crystal plate (e.g., plates of or ) and the examined plate by the intensity of the transmitted radiation. Further, it shows that if nonmonochromatic radiation is used, then the spectrum of radiation at the output is determined by the relative orientation of the optical elements and their sizes. The paper gives the theoretical model for calculations of profile of spectra for the number of important cases of orientation of elements.