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Journal of Spectroscopy
Volume 2015, Article ID 574754, 6 pages
Research Article

Ultrafast Probe of Carrier Diffusion and Nongeminate Processes in a Single CdSSe Nanowire

1Department of Chemistry and Biochemistry, University of Delaware, Newark, DE 19716, USA
2Department of Physics and Astronomy, University of Delaware, Newark, DE 19716, USA

Received 31 October 2014; Accepted 19 February 2015

Academic Editor: Pedro D. Vaz

Copyright © 2015 Peter S. Eldridge et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


We measure ultrafast carrier dynamics in a single CdSSe nanowire at different excitation fluences using an ultrafast Kerr-gated microscope. The time-resolved emission exhibits a dependence on excitation fluence, with the onset of the emission varying on the picosecond time scale with increasing laser power. By fitting the emission to a model for amplified spontaneous emission (ASE), we are able to extract the nonradiative carrier recombination lifetime and nongeminate recombination constant. The extracted nongeminate recombination constant suggests that our measurement technique allows the access to the nondiffusion limited recombination regime in nanowires with low carrier mobility.