Table of Contents Author Guidelines Submit a Manuscript
Journal of Spectroscopy
Volume 2015, Article ID 618279, 7 pages
http://dx.doi.org/10.1155/2015/618279
Research Article

Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence

1Facultad de Matemática Astronomía y Física, Universidad Nacional de Córdoba, 5000 Córdoba, Argentina
2CONICET, Argentina
3Laboratorio Nacional de Luz Síncrotron, CP 6192, 13084-971 Campinas, Brazil

Received 23 October 2014; Accepted 16 February 2015

Academic Editor: Rafal Sitko

Copyright © 2015 Juan José Leani et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Linked References

  1. E.-E. Koch, Ed., Handbook on Synchrotron Radiation 1A, North-Holland, Amsterdam, The Netherlands, 1983.
  2. M. Born and E. Wolf, Principles of Optics, Pergamon Press, New York, NY, USA, 1980.
  3. L. G. Parrat, “Surface studies of solids by total reflection of X-rays,” Physical Review, vol. 95, p. 359, 1954. View at Publisher · View at Google Scholar
  4. M. Tolan, X-Ray Scattering from Soft-Matter Thin Films, Springer, Berlin, Germany, 1999. View at Publisher · View at Google Scholar
  5. A. Iida, A. Yoshinaga, K. Sakurai, and Y. Gohshi, “Synchrotron radiation excited X-ray fluorescence analysis using total reflection of X-rays,” Analytical Chemistry, vol. 58, no. 2, pp. 394–397, 1986. View at Publisher · View at Google Scholar · View at Scopus
  6. C. Vázquez, S. Boeykens, and D. Elkin, “The use of total reflection X-ray fluorescence in an underwater archaeology case study,” Technical Briefs in Historical Archaeology, vol. 5, pp. 10–15, 2010. View at Google Scholar
  7. A. Prange, “Total reflection X-ray spectrometry: method and applications,” Spectrochimica Acta Part B: Atomic Spectroscopy, vol. 44, no. 5, pp. 437–452, 1989. View at Publisher · View at Google Scholar · View at Scopus
  8. R. Klockenkāmper and A. von Bohlen, “Total reflection X-ray fluorescence—an efficient method for micro-, trace and surface layer analysis. Invited lecture,” Journal of Analytical Atomic Spectrometry, vol. 7, no. 2, pp. 273–279, 1992. View at Publisher · View at Google Scholar
  9. R. Barchewitz, M. Cremonese-Visicato, and G. Onori, “X-ray photoabsorption of solids by specular reflection,” Journal of Physics C: Solid State Physics, vol. 11, no. 21, article 019, pp. 4439–4445, 1978. View at Publisher · View at Google Scholar · View at Scopus
  10. B. M. Murphy, M. Müller, J. Stettner et al., “Investigating surface dynamics with inelastic X-ray scattering,” Journal of Physics Condensed Matter, vol. 20, no. 22, Article ID 224001, 2008. View at Publisher · View at Google Scholar · View at Scopus
  11. T. T. Fister, D. D. Fong, J. A. Eastman et al., “Total-reflection inelastic x-ray scattering from a 10-nm thick La0.6Sr0.4CoO3 thin film,” Physical Review Letters, vol. 106, no. 3, Article ID 037401, 2011. View at Publisher · View at Google Scholar · View at Scopus
  12. A. G. Karydas and T. Paradellis, “Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced X-ray beam,” Journal of Physics B: Atomic, Molecular and Optical Physics, vol. 30, no. 8, pp. 1893–1905, 1997. View at Publisher · View at Google Scholar
  13. G. Brown and D. E. Moncton, Handbook on Synchrotron Radiation, vol. 3, North Holland Publishing Company, 1991.
  14. J. J. Leani, H. Sánchez, M. Valentinuzzi, and C. Pérez, “Chemical environment determination of iron oxides using RRS spectroscopy,” X-Ray Spectrometry, vol. 40, no. 4, pp. 254–256, 2011. View at Publisher · View at Google Scholar · View at Scopus
  15. J.-E. Rubensson, “RIXS dynamics for beginners,” Journal of Electron Spectroscopy and Related Phenomena, vol. 110-111, pp. 135–151, 2000. View at Publisher · View at Google Scholar · View at Scopus
  16. J. Szlachetko, J.-Cl. Dousse, M. Berset, K. Fennane, and M. Szlachetko, “High-resolution study of the x-ray resonant Raman scattering process around the 1s absorption edge for aluminium, silicon, and their oxides,” Physical Review A, vol. 75, no. 2, Article ID 022512, 11 pages, 2007. View at Publisher · View at Google Scholar
  17. H. Hayashi, “Lifetime-broadening-suppressed selective XAFS spectroscopy,” Analytical Sciences, vol. 24, no. 1, pp. 15–23, 2008. View at Publisher · View at Google Scholar · View at Scopus
  18. G. Dräger and P. Machek, “Numerical method for inverting 1s2p resonant inelastic x-ray scattering spectra: interpretation of hidden electronic excitations in CuO,” Physical Review B, vol. 79, no. 3, Article ID 033103, 4 pages, 2009. View at Publisher · View at Google Scholar
  19. H. Hayashi, “SIM-RIXS: a program to simulate resonant inelastic X-ray scattering,” X-Ray Spectrometry, vol. 40, no. 1, pp. 24–30, 2011. View at Publisher · View at Google Scholar · View at Scopus
  20. M. Kavčič, M. Žitnik, K. Bučar, and J. Szlachetko, “Application of wavelength dispersive X-ray spectroscopy to improve detection limits in X-ray analysis,” X-Ray Spectrometry, vol. 40, no. 1, pp. 2–6, 2011. View at Publisher · View at Google Scholar · View at Scopus
  21. F. Meirer, C. Streli, G. Pepponi et al., “Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surface,” Surface and Interface Analysis, vol. 40, no. 12, pp. 1571–1576, 2008. View at Publisher · View at Google Scholar · View at Scopus
  22. J. J. Leani, H. J. Sánchez, R. D. Pérez, and C. Pérez, “Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions,” Analytical Chemistry, vol. 85, no. 15, pp. 7069–7075, 2013. View at Publisher · View at Google Scholar · View at Scopus
  23. C. A. Pérez, M. Radtke, H. J. Sánchez et al., “Synchrotron radiation x-ray fluorescence at the LNLS: beamline instrumentation and experiments,” X-Ray Spectrometry, vol. 28, no. 5, pp. 320–326, 1999. View at Google Scholar · View at Scopus
  24. A. R. D. Rodrigues, R. H. A. Farias, M. J. Ferreira et al., “Commissioning and operation of the Brazilian synchrotron light source,” in Proceedings of the 17th Particle Accelerator Conference (PAC '97), pp. 811–813, Vancouver, Canada, May 1997. View at Scopus
  25. A. Kotani and S. Shin, “Resonant inelastic X-ray scattering spectra for electrons in solids,” Reviews of Modern Physics, vol. 73, pp. 203–246, 2001. View at Publisher · View at Google Scholar
  26. P. Eisenberger, P. M. Platzman, and H. Winick, “X-ray resonant Raman scattering: observation of characteristic radiation narrower than the lifetime width,” Physical Review Letters, vol. 36, no. 11, pp. 623–626, 1976. View at Publisher · View at Google Scholar · View at Scopus
  27. J. M. Hubbell and S. M. Seltzer, Tables of X-Ray Mass Absorption Coefficients and Mass Energy, 5632, NISTIR, 1995.
  28. D. R. Lide, Ed., Handbook of Chemistry and Physics, CRC Press, Boca Raton, Fla, USA, 80th edition, 1999.
  29. SeaSolve Software, PeakFit v4.12 for Windows, SeaSolve Software, 2003, Portions Copyright 2000–2003 SYSTAT Software.
  30. TableCurve v1.11 for Windows, AISN Software, 1993.
  31. Q. Zhang, R. Aliaga-Rossel, and P. Choi, “Denoising of gamma-ray signals by interval-dependent thresholds of wavelet analysis,” Measurement Science and Technology, vol. 17, no. 4, pp. 731–735, 2006. View at Publisher · View at Google Scholar · View at Scopus
  32. J. J. Leani, H. J. Sánchez, M. Valentinuzzi, and C. Pérez, “Determination of the oxidation state by resonant-Raman scattering spectroscopy,” Journal of Analytical Atomic Spectrometry, vol. 26, no. 2, pp. 378–382, 2011. View at Publisher · View at Google Scholar · View at Scopus
  33. H. J. Sánchez, M. C. Valentinuzzi, and J. J. Leani, “Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis,” Journal of Analytical Atomic Spectrometry, vol. 27, no. 2, pp. 232–238, 2012. View at Publisher · View at Google Scholar · View at Scopus
  34. Y. B. Bannett, D. C. Rapaport, and I. Freund, “Resonant x-ray Raman scattering and the infrared divergence of the compton effect,” Physical Review A, vol. 16, no. 5, article 2011, 1977. View at Publisher · View at Google Scholar · View at Scopus
  35. H. Hayashi, Y. Udagawa, W. A. Caliebe, and C.-C. Kao, “Lifetime-broadening removed X-ray absorption near edge structure by resonant inelastic X-ray scattering spectroscopy,” Chemical Physics Letters, vol. 371, no. 1-2, pp. 125–130, 2003. View at Publisher · View at Google Scholar · View at Scopus
  36. R. K. Gupta, K. Ghosh, R. Patel, and P. K. Kahol, “A novel method to synthesis magnetic thin film of iron oxide,” Journal of Alloys and Compounds, vol. 509, no. 27, pp. 7529–7531, 2011. View at Publisher · View at Google Scholar · View at Scopus