Journal of Spectroscopy / 2015 / Article / Fig 6

Research Article

ZnO/ZnAl2O4 Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

Figure 6

XPS survey spectra of the ZnO/ZnAl2O4 as-deposited (black line) and sputter-cleaned (red line) films treated at 700°C for 1 h (a), Zn 2p XPS spectrum (b), Al 2p XPS spectrum (c), Al 2s and Zn 3s XPS spectrum (d), O 1s XPS spectrum (e), and C 1s, S 2p, and S 2s XPS spectrum (f) of the samples.

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