Journal of Spectroscopy / 2015 / Article / Fig 6

Research Article

ZnO/ZnAl2O4 Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

Figure 6

XPS survey spectra of the ZnO/ZnAl2O4 as-deposited (black line) and sputter-cleaned (red line) films treated at 700°C for 1 h (a), Zn 2p XPS spectrum (b), Al 2p XPS spectrum (c), Al 2s and Zn 3s XPS spectrum (d), O 1s XPS spectrum (e), and C 1s, S 2p, and S 2s XPS spectrum (f) of the samples.
(a)
(b)
(c)
(d)
(e)
(f)

We are committed to sharing findings related to COVID-19 as quickly as possible. We will be providing unlimited waivers of publication charges for accepted research articles as well as case reports and case series related to COVID-19. Review articles are excluded from this waiver policy. Sign up here as a reviewer to help fast-track new submissions.