Journal of Spectroscopy / 2015 / Article / Tab 1

Research Article

ZnO/ZnAl2O4 Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

Table 1

X-ray diffraction data for ZnO/ZnAl2O4 nanocomposite films (annealed at 700°C).

Pos. [°2Th.]FWHM [°2Th.]Identified planes () (Å)Relative intensity (%)

31.30570.8839220 ZnAl2O42.85719.08
31.81550.1537100 ZnO2.81331.48
34.51180.2024002 ZnO2.599100.00
36.37250.2267101 ZnO2.47053.29
36.86500.7104311 ZnAl2O42.43830.54
44.80920.6298400 ZnAl2O42.0232.24
47.65040.3149102 ZnO1.9099.37
55.64190.6298422 ZnAl2O41.6523.65
56.71920.2362110 ZnO1.6239.83
59.36610.6298511 ZnAl2O41.5576.27
62.97040.3149103 ZnO1.4768.90
65.25770.4723440 ZnAl2O41.4309.10
68.07990.2880112 ZnO1.3765.60

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