Research Article
XPS, FTIR, EDX, and XRD Analysis of Al2O3 Scales Grown on PM2000 Alloy
Table 1
Composition and stoichiometry of the thin films obtained by statistical analysis of EDX spectrum.
| Element | (keV) | Atom%, PM2000, 873 K | Atom%, PM2000, 1073 K | Atom%, PM2000, 1173 K | Atom%, PM2000, 1473 K |
| C K | 0.277 | 4 | 5 | 2 | <1 | O K | 0.525 | 15 | 38 | 55 | 59 | Mg K | 1.253 | <1 | <1 | <1 | 5 | Al K | 1.486 | 11 | 21 | 34 | 34 | Si K | 1.739 | <1 | <1 | 0 | 0 | Cr K | 5.411 | 17 | 9 | 3 | <1 | Fe K | 6.398 | 52 | 26 | 5 | <1 | Y L | 1.922 | | | <1 | 0 | Zr L | 2.042 | | | | 0 | Al/O ratio | | 0.709 | 0.560 | 0.618 | 0.578 |
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