Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF

<div>Calibration curve for net area of K<i>α</i> line of calcium (Ca) versus thickness of vanadium determined by SEM.</div>

Journal of Spectroscopy

Figure 7: Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF 