Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF

<div>PXRF spectrum of vanadium layer on a glass substrate for the thickness of 185.7 nm. Measurement time 300 s.</div>

Journal of Spectroscopy

Figure 9: Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF 