Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF

<table class="table-group" id="tab1"><tr><td><table class="table"><tr><td class="thead-hr" colspan="5"><hr/></td></tr><tr class="thead"><td class="align_left" rowspan="2">Element</td><td class="align_center" rowspan="2">Energy (keV)</td><td class="align_center" rowspan="2">Peak/background</td><td class="align_center" colspan="2">         FWHM</td></tr><tr class="thead"><td class="align_center">(Channel)</td><td class="align_center">(keV)</td></tr><tr><td class="thead-hr" colspan="5"><hr/></td></tr><tr><td class="align_left">Fe</td><td class="align_center">6.40</td><td class="align_center">1.15</td><td class="align_center">4.99</td><td class="align_center">0.14</td></tr><tr><td class="align_left">Ca</td><td class="align_center">3.69</td><td class="align_center">1.07</td><td class="align_center">4.12</td><td class="align_center">0.11</td></tr><tr class="table-tr"><td colspan="5"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

Average values for the ratio peak/background and FWHM for the glass substrate number 5.

Journal of Spectroscopy

tab1

Table 1

Table 1: Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF 

Journal of Spectroscopy

Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF

Table 1

Thickness Measurement of V₂O₅ Nanometric Thin Films Using a Portable XRF