Research Article

Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF

Table 4

Thickness of unknown samples of the vanadium films calculated.

Mass Net areaThickness Superficial density
(mg)Ca-Kα(nm)(μg/cm2)

45 ± 2.59783 ± 108 62 ± 3.320.8 ± 0.2
55 ± 2.59512 ± 16775.6 ± 4.125.4 ± 0.4
130 ± 2.58132 ± 93185.7± 6.062.4 ± 0.9