XPS and FT-IR Characterization of Selected Synthetic Corrosion Products of Zinc Expected in Neutral Environment Containing Chloride Ions

<div>Zn 2p<sub>3/2</sub> photoelectron spectra for ZnO (a) and Zn(OH)<sub>2</sub> (b) in the as-received form and for Zn(OH)<sub>2</sub> after Ar<sup>+</sup> sputter cleaning (c).</div>

Journal of Spectroscopy

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Figure 6

Figure 6: XPS and FT-IR Characterization of Selected Synthetic Corrosion Products of Zinc Expected in Neutral Environment Containing Chloride Ions 