Research Article
Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon
Figure 12
Raman intensity distribution under off-axis scattering (βI = 30°, βS = 0°) for different sample rotation angles α and polarization directions φ in the (a) HH case and (b) HV case.
| (a) |
| (b) |