Research Article
Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon
Figure 19
Raman intensity distribution under the oblique backscattering configuration (βi = βs = 30°) for different polarization directions φ in the (a) HH case and (b) HV case considering and not considering the influence of the refractive index and depolarization.
| (a) |
| (b) |