Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon

Figure 5

Raman intensity distribution under the oblique backscattering configuration for different inclination angles β and polarization directions φ when α = 30° in the (a) HH case and (b) HV case.

(a)

(b)