Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon

Figure 7

Raman intensity distribution under the oblique backscattering configuration (β = 30°) for different sample rotation angles α and polarization directions φ in the (a) HH case and (b) HV case.

(a)

(b)