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Mobile Information Systems
Volume 6 (2010), Issue 2, Pages 177-191

Recovery of Flash Memories for Reliable Mobile Storages

Daesung Moon,1 Byungkwan Park,2 Yongwha Chung,3 and Jin-Won Park4

1knowledge Information Security Research Department, ETRI, 161 Gajeong-dong, Yuseong-gu, Daejeon, 305–700, Republic of Korea
2Department of Computer and Information Science, Sunmoon University, Asan, Chungnam 336–708, Republic of Korea
3Department of Computer and Information Science, Korea University, Jochiwon, Chungnam 339–700, Republic of Korea
4School of Games, Hongik University, Jochiwon, ChungNam 339–701, Republic of Korea

Received 10 June 2010; Accepted 10 June 2010

Copyright © 2010 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


As the mobile appliance is applied to many ubiquitous services and the importance of the information stored in it is increased, the security issue to protect the information becomes one of the major concerns. However, most previous researches focused only on the communication security, not the storage security. Especially, a flash memory whose operational characteristics are different from those of HDD is used increasingly as a storage device for the mobile appliance because of its resistance to physical shock and lower power requirement. In this paper, we propose a flash memory management scheme targeted for guaranteeing the data integrity of the mobile storage. By maintaining the old data specified during the recovery window, we can recover the old data when the mobile appliance is attacked. Also, to reduce the storage requirement for the recovery, we restrict the number of versions to be copied, called Degree of Integrity (DoI). Especially, we consider both the reclaim efficiency and the wear leveling which is a unique characteristic of the flash memory. Based on the performance evaluation, we confirm that the proposed scheme can be acceptable to many applications as a flash memory management scheme for improving data integrity.