Research Article
Applying Artificial Neural Network to Predict Semiconductor Machine Outliers
Table 1
Network training and performance tests.
| Hidden neuron | 1 month (a) | 3 months (b) | 6 months (c) | MSE | Train-R | MSE | Train-R | MSE | Train-R |
| 1 | 0.0162 | 0.5873 | 0.0132 | 0.6773 | 0.0173 | 0.5643 | 2 | 0.0154 | 0.6032 | 0.0136 | 0.6832 | 0.0163 | 0.5932 | 3 | 0.0165 | 0.6244 | 0.0142 | 0.6834 | 0.0166 | 0.4934 | 4 | 0.0166 | 0.5873 | 0.0136 | 0.6583 | 0.0169 | 0.5274 | 5 | 0.0169 | 0.5972 | 0.0139 | 0.6572 | 0.0162 | 0.5843 | 6 | 0.0157 | 0.5878 | 0.0147 | 0.6978 | 0.0164 | 0.5032 | 7 | 0.0168 | 0.5983 | 0.0148 | 0.5783 | 0.0177 | 0.5836 | 8 | 0.0163 | 0.5973 | 0.0143 | 0.6373 | 0.0179 | 0.5787 | 9 | 0.0168 | 0.6036 | 0.0138 | 0.6439 | 0.0185 | 0.5897 | 10 | 0.0169 | 0.6092 | 0.0145 | 0.6899 | 0.0187 | 0.5554 |
| Average | 0.01641 | 0.59956 | 0.01406 | 0.66066 | 0.01725 | 0.55732 |
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Denote: MSE is mean square error; Train-R is correlation coefficient.
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