Micro Surface Defect Detection Method for Silicon Steel Strip Based on Saliency Convex Active Contour Model

<table class="table-group" width="800px"><tr class="fig-image" id="a"><td><img alt="429094.fig.005a" src="https://static.hindawi.com/articles/mpe/volume-2013/429094/figures/429094.fig.005a.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(a) </b>Saliency map</td></tr></table></td></tr><tr class="fig-image" id="b"><td><img alt="429094.fig.005b" src="https://static.hindawi.com/articles/mpe/volume-2013/429094/figures/429094.fig.005b.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(b) </b>Surface plot of saliency map</td></tr></table></td></tr></table>

<table>Saliency map and its surface plot.</table>

Mathematical Problems in Engineering

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Figure 5

Figure 5: Micro Surface Defect Detection Method for Silicon Steel Strip Based on Saliency Convex Active Contour Model 