Research Article

Micro Surface Defect Detection Method for Silicon Steel Strip Based on Saliency Convex Active Contour Model

Table 1

The performance criteria of detecting spot-defect for two methods.

ImageMethodNTDNFDNMD

SDI_1SBM1370
SCACM100

SDI_2SBM11790
SCACM110

SDI_3SBM1800
SCACM100

SDI_4SBM2340
SCACM200

SDI_5SBM1320
SCACM100

SDI_6SBM1190
SCACM100

SDI_7SBM1240
SCACM120

SDI_8SBM3330
SCACM201