Scheduling Semiconductor Multihead Testers Using Metaheuristic Techniques Embedded with Lot-Specific and Configuration-Specific Information

Table 1

Information about configurations.

𝑔	1	2	3
Ending events	Lot 4 completed	Lot 2 completed	Head 3 changeover completed
𝑃𝑔	1,2,4	1,2	1
𝑐𝑔	max{𝑡1+𝑡2+𝑡4,max(𝑡1+ℎ1,𝑡2+ℎ2,𝑡4+ℎ4)}	max{𝑡1+𝑡2,max(𝑡1+ℎ1,𝑡2+ℎ2)}	max{𝑡1,𝑡1+ℎ1}=𝑡1+ℎ1
𝑓𝑔	max(𝑡1+ℎ1,𝑡2+ℎ2,𝑡4+ℎ4)−(𝑡1+𝑡2+𝑡4)	max(𝑡1+ℎ1,𝑡2+ℎ2)−(𝑡1+𝑡2)	(𝑡1+ℎ1)−𝑡1=ℎ1
𝑢𝑔	𝑛4	𝑛2−𝑛4	𝑏3/𝑐3
𝑏𝑔	𝑐1⋅𝑢1	𝑐2⋅𝑢2	𝑒3−𝑒2
𝑒𝑔	𝑏1	𝑏2+𝑒1	𝑒1+ changeover time