Scheduling Semiconductor Multihead Testers Using Metaheuristic Techniques Embedded with Lot-Specific and Configuration-Specific Information

Table 2

Lot information (changeover time = 150).

Lot number	Testing time	Handling time	Lot size
1	6	11	100
2	7	9	150
3	4	5	200
4	5	8	200
5	8	6	100
6	3	4	150