Scheduling Semiconductor Multihead Testers Using Metaheuristic Techniques Embedded with Lot-Specific and Configuration-Specific Information

Table 3

Steps of the heuristic grouping method.

Step	𝑇	𝐻	1st in 𝐻	𝑧	𝑃
1	5,2,1,4,3,6	1,2,4,5,3,6	1	𝜙	𝜙
	Description: generate T and H
2	5,2,4,3,6	2,4,5,3,6	2	1	𝜙
	Description: put lot 1 onto the test head
3	5,3,6	5,3,6	5	1	2,4
	Description: select lots 2 and 4 from 𝑇 and put onto the test head
4	3,6	3,6	6	5	2,4
	Description: lot 1 finishes testing; then select lot 5 for testing from 𝑇.
5	3	3	3	5	4,6
	Description: lot 2 finishes testing; then select lot 6 for testing from 𝑇.
6	𝜙	𝜙	𝜙	5	3,6
	Description: Lot 4 finishes testing; then select lot 3 for testing from 𝑇.