Scheduling Semiconductor Multihead Testers Using Metaheuristic Techniques Embedded with Lot-Specific and Configuration-Specific Information

Table 5

Configuration information.

𝑔	𝑐𝑔	𝑓𝑔	𝑃𝑔	𝑢𝑔	𝑏𝑔	𝑒𝑔
1	18	−1	1,2,4	100	1800	1800
2	16	4	2,4	9	150	1950
3	20	−4	5,2,4	41	820	2770
4	14	1	5,4	10	150	2920
5	16	−2	5,6,4	40	640	3560
6	14	3	5,6	9	126	3686
7	7	4	6	3	24	3710
8	9	2	6,3	98	882	4592
9	9	5	3	102	921	5234