Scheduling Semiconductor Multihead Testers Using Metaheuristic Techniques Embedded with Lot-Specific and Configuration-Specific Information

Table 6

The parameters of lots of a known optimal problem experiment.

Lot number	Testing time	Handling time	Lot size
1	1.0	1.0	2000
2	1.2	0.9	1500
3	0.8	1.6	1000
4	1.2	2.0	1000
5	1.5	0.8	2500
6	1.0	0.6	2500