Quality-Related Process Monitoring Based on Total Kernel PLS Model and Its Industrial Application

Table 5

Fault detection rate of TEP using T-PLS, KPLS, and T-KPLS (%).

Faults ID	Type	T-PLS	KPLS	T-KPLS
IDV(1)	Step	99.3	88.6	99.7
IDV(2)	Step	97.6	98.6	99.6
IDV(5)	Step	99.5	48.2	97.4
IDV(6)	Step	99.8	99.5	99.8
IDV(8)	Random variation	93.4	95.6	97.3
IDV(12)	Random variation	95.6	99.8	98.3
IDV(13)	Slow drift	95.3	96.4	98.5