A Bayesian Framework for Reliability Assessment via Wiener Process and MCMC

Table 5

Degradation history of a particular laser device.

𝑡 (hour)	250	500	750	1000	1250	1500	1750	2000	2250	2500	2750	3000	3250	3500	3750	4000
𝑋(𝑡)	0.45	0.96	1.57	2.01	2.59	3.15	3.63	4.16	4.66	5.15	5.63	6.14	6.64	7.14	7.60	8.15