A Bayesian Framework for Reliability Assessment via Wiener Process and MCMC

Table 6

Updating parameters at different time for particular laser device.

𝑡 (hour)	250	1000	2000	3000
𝜇	1.919𝐸−3	1.992𝐸−3	2.052𝐸−3	2.032𝐸−3
𝜎^2	8.76𝐸−5	6.99𝐸−5	5.38𝐸−5	4.27𝐸−5