New Strategy for Analog Circuit Performance Evaluation under Disturbance and Fault Value

Table 3

Result of data feature and comparative error of testing sample.

TSSN	Method	Test MAE				Test MSE
		𝐴𝑢	𝑈𝑜𝑚	𝑈𝑠	𝑈𝑁	𝐴𝑢	𝑈𝑜𝑚	𝑈𝑠	𝑈𝑁
100 × 100	DWMK-FSVM	0.0667	0.1035	0.1128	0.1933	0.0201	0.0103	0.0114	0.0993
100 × 100	LSSVR	0.7127	0.3069	0.2369	0.2309	0.1402	0.1026	0.0765	0.2774
100 × 100	𝜀-SVR	0.7277	0.3478	0.2860	0.2662	0.2895	0.2719	0.2657	0.2951