Accelerated Testing with Multiple Failure Modes under Several Temperature Conditions

Table 1

Failure times of devices.

Temp.	Failure time/h
	Failure 1	Failure 2	Failure 3	Failure 4
373 K	35, 43, 53, 62, 73, 89	85, 96, 115, 127	No sample	No sample
353 K	76, 83, 93, 102,	162, 178, 182	No sample	No sample
213 K	No sample	No sample	106, 123, 135, 139	173, 193
193 K	No sample	No sample	18, 29, 37, 45, 53, 69	78, 89, 95, 97