Table of Contents Author Guidelines Submit a Manuscript
Mathematical Problems in Engineering
Volume 2014, Article ID 879402, 13 pages
http://dx.doi.org/10.1155/2014/879402
Research Article

Handling Fault Diagnosis Problem of Linear-Analogue Circuits with Voltage Phasor Measurement

School of Automation Engineering, University of Electronical Science and Technology of China, Chengdu 611731, China

Received 11 April 2014; Accepted 4 August 2014; Published 28 August 2014

Academic Editor: Yuqiang Wu

Copyright © 2014 Xin Gao et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Linked References

  1. F. Li and P. Woo, “Fault detection for linear analog IC—the method of short-circuit admittance parameters,” IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, vol. 49, no. 1, pp. 105–108, 2002. View at Publisher · View at Google Scholar · View at Scopus
  2. Y. K. Sun, Study on Fault Diagnosis in Analog Circuit based on Support Vector Machine, University of Electronic Science and Technology of China, Chengdu, China, 2009.
  3. D. Grzechca and J. Rutkowski, “Creation of analog fault AC dictionary based on fuzzy C neural network and output coding,” in Proceedings of the European Conference on Circuit Theory and Design, pp. 237–240, Cracow, Poland, 2003.
  4. D. Grzechca, T. Golonek, and J. Rutkowski, “Analog fault AC dictionary creation—the fuzzy set approach,” in Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS '06), pp. 5744–5747, Island of Kos, Greece, May 2006. View at Publisher · View at Google Scholar
  5. D. Grzechca and L. Chruszczyk, “Wavelet C neural network to analog paramteric fault circuit location,” in Proceedings of the 13th International Mixed Signals Testing Workshop and 3rd GHz/ Gbps Test Workshop, pp. 2–6, Povoa de Varzim, Portugal, 2007.
  6. A. Balivada, J. Chen, and J. A. Abraham, “Analog testing with time response parameters,” IEEE Design and Test of Computers, vol. 13, no. 2, pp. 18–25, 1996. View at Publisher · View at Google Scholar · View at Scopus
  7. L. Chruszczyk, D. Grzechca, and J. Rutkowski, “Finding of optimal excitation signal for testing of analog electronic circuits,” in Proceedings of the International Conference on Signals and Electronic Systems, pp. 613–616, Lodz, Poland, 2006.
  8. L. Chruszczyk and J. Rutkowski, “Optimal excitation in fault diagnosis of analog electronic circuits,” in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, Valletta, Malta, 2008.
  9. H. Dai and T. M. Souders, “Time domain testing strategies and fault diagnosis for analog systems,” in Proceedings of the IEEE Instrumentation and Measurement Technology Conference, pp. 293–298, Washington, DC, USA, April 1989. View at Scopus
  10. B. Long, S. Tian, and H. Wang, “Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features,” Journal of Electronic Testing: Theory and Applications, vol. 28, no. 3, pp. 291–300, 2012. View at Publisher · View at Google Scholar · View at Scopus
  11. M. Aminian and F. Aminian, “Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor,” IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol. 47, no. 2, pp. 151–156, 2000. View at Publisher · View at Google Scholar · View at Scopus
  12. J. B. Jin and X. Z. Liu, Circuit Analysis, Xianxidian University Press, 3rd edition, 2009.
  13. R. L. Boylestad, Introductory Circuit Analysis, Prentice Hall, Englewood Cliff, NJ, USA, 10th edition, 2002.
  14. P. Wang and S.-Y. Yang, “A soft fault dictionary method for analog circuit diagnosis based on slope fault mode,” Control and Automation, vol. 22, no. 6, pp. 1–23, 2006. View at Google Scholar
  15. G. Fedi, S. Manetti, M. C. Piccirilli, and J. Starzyk, “Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits,” IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, vol. 46, no. 7, pp. 779–787, 1999. View at Publisher · View at Google Scholar · View at Scopus
  16. F. Grasso, A. Luchetta, S. Manetti, and M. C. Piccirilli, “A method for the automatic selection of test frequencies in analog fault diagnosis,” IEEE Transactions on Instrumentation and Measurement, vol. 56, no. 6, pp. 2322–2329, 2007. View at Publisher · View at Google Scholar · View at Scopus
  17. J. A. Starzyk, J. Pang, S. Manetti, and G. Fedi, “Finding ambiguity groups in low testability analog circuits,” IEEE Transactions on Circuits and Systems. I. Fundamental Theory and Applications, vol. 47, no. 8, pp. 1125–1137, 2000. View at Publisher · View at Google Scholar · View at MathSciNet · View at Scopus
  18. N. Sen and R. Saeks, “Fault diagnosis for linear systems via multifrequency measurements,” IEEE Transactions on Circuits and Systems, vol. 26, no. 7, pp. 457–465, 1979. View at Publisher · View at Google Scholar · View at MathSciNet · View at Scopus