Clustering Ensemble for Identifying Defective Wafer Bin Map in Semiconductor Manufacturing

Procedure 1

-means algorithm.

(1) Randomly select data as the centroid of cluster

(2) Repeat

  For each data vector, assign each data into the group with respect to the closest centroid by

    minimum Euclidean distance.

   recalculate the new centroid based on all data within the group.

  end for

(3) Steps 1 and 2 are iterated until there is no data change.