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Mathematical Problems in Engineering
Volume 2015, Article ID 707358, 11 pages
http://dx.doi.org/10.1155/2015/707358
Research Article

Clustering Ensemble for Identifying Defective Wafer Bin Map in Semiconductor Manufacturing

Department of Information Management and Innovation Center for Big Data & Digital Convergence, Yuan Ze University, Chungli, Taoyuan 32003, Taiwan

Received 30 October 2014; Revised 27 January 2015; Accepted 28 January 2015

Academic Editor: Chiwoon Cho

Copyright © 2015 Chia-Yu Hsu. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Chia-Yu Hsu, “Clustering Ensemble for Identifying Defective Wafer Bin Map in Semiconductor Manufacturing,” Mathematical Problems in Engineering, vol. 2015, Article ID 707358, 11 pages, 2015. https://doi.org/10.1155/2015/707358.